Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937047 | Integrated circuit with test pad structure and method of testing | Tu-Anh N. Tran, Richard K. Eguchi, Peter R. Harper, William Williams, III, Lois Yong | 2005-08-30 |
| 6933614 | Integrated circuit die having a copper contact and method therefor | Fuaida Harun, Kevin J. Hess, Lan Chu Tan, Cheng Choi Yong | 2005-08-23 |