Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937047 | Integrated circuit with test pad structure and method of testing | Tu-Anh N. Tran, Richard K. Eguchi, Peter R. Harper, Chu-Chung Lee, William Williams, III | 2005-08-30 |
| 6844631 | Semiconductor device having a bond pad and method therefor | Peter R. Harper, Tu-Anh N. Tran, Jeffrey W. Metz, George R. Leal, Dieu Dinh | 2005-01-18 |