Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6835578 | Test structure for differentiating the line and via contribution in stress migration | Li-Te Lin | 2004-12-28 |
| 6831365 | Method and pattern for reducing interconnect failures | Chih-Hsiang Yao, Wen-Kai Wan, Tai-Chun Huang | 2004-12-14 |
| 6737345 | Scheme to define laser fuse in dual damascene CU process | Kang-Cheng Lin | 2004-05-18 |