Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6825053 | Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2004-11-30 |
| 6812487 | Test key and method for validating the doping concentration of buried layers within a deep trench capacitors | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang, Tse-Main Kuo | 2004-11-02 |
| 6801462 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Ming-Cheng Chang, Jeng-Ping Lin | 2004-10-05 |
| 6788598 | Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof | Ming-Cheng Chang, Jeng-Ping Lin, Tse-Main Kuo, Hsu-Cheng Fan | 2004-09-07 |
| 6693834 | Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2004-02-17 |