Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6788598 | Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof | Ming-Cheng Chang, Tie Jiang Wu, Jeng-Ping Lin, Tse-Main Kuo | 2004-09-07 |