Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6798224 | Method for testing semiconductor wafers | David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy | 2004-09-28 |
| 6677776 | Method and system having switching network for testing semiconductor components on a substrate | Salman Akram, Jorge L. de Varona | 2004-01-13 |