DZ

Dorian Zahorski

KL Kla-Tencor: 1 patents #33 of 118Top 30%
Overall (2004): #231,040 of 270,089Top 90%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6734967 Focused beam spectroscopic ellipsometry method and system Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more 2004-05-11