Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6781688 | Process for identifying defects in a substrate having non-uniform surface properties | George Kren, Mehdi Vaez-Iravani | 2004-08-24 |
| 6686996 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, Hans J. Hansen, Daniel Kavaldjiev +1 more | 2004-02-03 |