Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6770868 | Critical dimension scanning electron microscope | David E. Clapper | 2004-08-03 |
| 6770879 | Motion picture output from electron microscope | Amir Azordegan, Bharat Marathe, David R. Bakker | 2004-08-03 |
| 6686996 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, Hans J. Hansen, David W. Shortt +1 more | 2004-02-03 |