Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816990 | VLSI chip test power reduction | Peilin Song, Timothy J. Koprowski, Franco Motika | 2004-11-09 |
| 6774656 | Self-test for leakage current of driver/receiver stages | Otto A. Torreiter, Joseph Eckelman, David Hui | 2004-08-10 |
| 6728914 | Random path delay testing methodology | Kevin William McCauley, William V. Huott, Mary P. Kusko, Peilin Song, Richard F. Rizzolo +1 more | 2004-04-27 |
| 6725171 | Self-test with split, asymmetric controlled driver output stage | Otto A. Torreiter, Joseph Eckelman, David Hui | 2004-04-20 |