Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6816990 | VLSI chip test power reduction | Timothy J. Koprowski, Ulrich Baur, Franco Motika | 2004-11-09 |
| 6728914 | Random path delay testing methodology | Kevin William McCauley, William V. Huott, Mary P. Kusko, Richard F. Rizzolo, Ulrich Baur +1 more | 2004-04-27 |