Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Rocco E. DeStefano, Joseph Eckelman, Thomas G. Foote, Steven Michnowski, Franco Motika +2 more | 2004-06-15 |
| 6728914 | Random path delay testing methodology | Kevin William McCauley, William V. Huott, Mary P. Kusko, Peilin Song, Ulrich Baur +1 more | 2004-04-27 |