Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6774656 | Self-test for leakage current of driver/receiver stages | Ulrich Baur, Otto A. Torreiter, David Hui | 2004-08-10 |
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Richard F. Rizzolo, Rocco E. DeStefano, Thomas G. Foote, Steven Michnowski, Franco Motika +2 more | 2004-06-15 |
| 6725171 | Self-test with split, asymmetric controlled driver output stage | Ulrich Baur, Otto A. Torreiter, David Hui | 2004-04-20 |