Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642150 | Method for testing for blind hole formed in wafer layer | Chuan-Chieh Huang, Ming-Shuo Yen, Chiang-Jen Peng, Pei-Hung Chen | 2003-11-04 |
| 6562696 | Method for forming an STI feature to avoid acidic etching of trench sidewalls | Jen-Tian Hsu | 2003-05-13 |