Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642150 | Method for testing for blind hole formed in wafer layer | Chuan-Chieh Huang, Wen-Hsiang Tang, Ming-Shuo Yen, Chiang-Jen Peng | 2003-11-04 |
PC
Pei-Hung Chen
Overall (2003): #143,120 of 273,478Top 55%
1
Patents 2003