Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642150 | Method for testing for blind hole formed in wafer layer | Chuan-Chieh Huang, Wen-Hsiang Tang, Chiang-Jen Peng, Pei-Hung Chen | 2003-11-04 |
| 6623995 | Optimized monitor method for a metal patterning process | Hsien-Tsong Chen, Woan Tyng Hwang, Yu-Chang Chen, Tien-Tzu Wen, Shion-Feng Chang Chien | 2003-09-23 |