Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642150 | Method for testing for blind hole formed in wafer layer | Wen-Hsiang Tang, Ming-Shuo Yen, Chiang-Jen Peng, Pei-Hung Chen | 2003-11-04 |
| 6566184 | Process to define N/PMOS poly patterns | Zin-Chein Wei, Chih-Hsiung Lee | 2003-05-20 |