Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6515293 | Method and apparatus for detecting thickness of thin layer formed on a wafer | Chung-Sam Jun, Sang-Mun Chon, Sang-bong Choi, Pil-Sik Hyun | 2003-02-04 |
HC
Hyun Suk Cho
Overall (2003): #208,077 of 273,478Top 80%
1
Patents 2003