Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6657715 | Sample inspection system | Mehdi Vaez-Iravani, Guoheng Zhao | 2003-12-02 |
| 6639662 | Sample inspection system | Mehdi Vaez-Iravani, Guoheng Zhao | 2003-10-28 |
| 6636302 | Scanning system for inspecting anamolies on surfaces | Mehrdad Nikoonahad | 2003-10-21 |
| 6618134 | Sample inspection system | Mehdi Vaez-Iravani, Guoheng Zhao | 2003-09-09 |
| 6608676 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Mehdi Vaez-Iravani | 2003-08-19 |
| 6577389 | System and methods for inspection of transparent mask substrates | Steve Biellak, Noah Bareket | 2003-06-10 |