Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6657715 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-12-02 |
| 6639662 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-10-28 |
| 6618134 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-09-09 |
| 6608676 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Stanley Stokowski | 2003-08-19 |
| 6578961 | Massively parallel inspection and imaging system | — | 2003-06-17 |
| 6538730 | Defect detection system | Jeffrey Rzepiela, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2003-03-25 |