Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6590645 | System and methods for classifying anomalies of sample surfaces | Wayne Chen, Mustafa Akbulut | 2003-07-08 |
| 6538730 | Defect detection system | Mehdi Vaez-Iravani, Jeffrey Rzepiela, Carl Treadwell, Robert W. Fiordalice | 2003-03-25 |