Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6624031 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2003-09-23 |
| 6602772 | Method for non-contact stress evaluation of wafer gate dielectric reliability | Eduard A. Cartier, James H. Stathis | 2003-08-05 |