Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6624031 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Eric Adler, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2003-09-23 |
| 6614124 | Simple 4T static ram cell for low power CMOS applications | Chung H. Lam, Randy W. Mann | 2003-09-02 |
| 6610585 | Method for forming a retrograde implant | Bryant C. Colwill, Terence B. Hook, Dennis Hoyniak | 2003-08-26 |
| 6529436 | Supply degradation compensation for memory self time circuits | — | 2003-03-04 |