Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6603321 | Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring | Alvin W. Strong, Timothy D. Sullivan, Deborah Tibel, Michael Ruprecht, Carole D. Graas | 2003-08-05 |
| 6518670 | Electrically porous on-chip decoupling/shielding layer | Jack A. Mandelman, Jeffrey P. Gambino, Richard A. Wachnik | 2003-02-11 |