Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6603321 | Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring | Ronald G. Filippi, Alvin W. Strong, Timothy D. Sullivan, Deborah Tibel, Michael Ruprecht | 2003-08-05 |
| 6570181 | Semiconductor metal interconnect reliability test structure | Larry Ting | 2003-05-27 |
| 6566211 | Surface modified interconnects | Robert H. Havemann | 2003-05-20 |