Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6618682 | Method for test optimization using historical and actual fabrication test data | Anne Elizabeth Gattiker, John L. Harris, Phillip J. Nigh, Leo A. Noel, William J. Thibault +2 more | 2003-09-09 |
| 6549150 | Integrated test structure and method for verification of microelectronic devices | John K. Masi, Patrick Miller, Mark S. Styduhar, Donald L. Wheater | 2003-04-15 |