Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6650130 | Integrated circuit device defect detection method and apparatus employing light emission imaging | Jeffrey A. Kash, David P. Vallet | 2003-11-18 |
| 6650768 | Using time resolved light emission from VLSI circuit devices for navigation on complex systems | Richard J. Evans, Jeffrey A. Kash, Daniel R. Knebel, Pia Naoko Sanda, James C. Tsang +1 more | 2003-11-18 |
| 6618682 | Method for test optimization using historical and actual fabrication test data | Raymond J. Bulaga, Anne Elizabeth Gattiker, John L. Harris, Leo A. Noel, William J. Thibault +2 more | 2003-09-09 |
| 6516432 | AC scan diagnostic method | Franco Motika, Peilin Song, Howard B. Druckerman | 2003-02-04 |