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Patrick Miller

IBM: 1 patents #1,943 of 5,539Top 40%
📍 Winooski, VT: #3 of 6 inventorsTop 50%
🗺 Vermont: #215 of 578 inventorsTop 40%
Overall (2003): #144,576 of 273,478Top 55%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6549150 Integrated test structure and method for verification of microelectronic devices Raymond J. Bulaga, John K. Masi, Mark S. Styduhar, Donald L. Wheater 2003-04-15