JM

John K. Masi

IBM: 1 patents #1,943 of 5,539Top 40%
📍 Colchester, VT: #22 of 61 inventorsTop 40%
🗺 Vermont: #215 of 578 inventorsTop 40%
Overall (2003): #191,874 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6549150 Integrated test structure and method for verification of microelectronic devices Raymond J. Bulaga, Patrick Miller, Mark S. Styduhar, Donald L. Wheater 2003-04-15