Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651226 | Process control using three dimensional reconstruction metrology | Erik Cho Houge, John M. McIntosh | 2003-11-18 |
| 6606371 | X-ray system | Michael J. Antonell, Erik Cho Houge, John M. McIntosh, Catherine Vartuli | 2003-08-12 |
| 6577970 | Method of determining a crystallographic quality of a material located on a substrate | Erik Cho Houge, John M. McIntosh, Fred Stevie, Catherine Vartuli | 2003-06-10 |
| 6534851 | Modular semiconductor substrates | Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Catherine Vartuli | 2003-03-18 |