Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6633032 | Mass spectrometer particle counter | Erik Cho Houge, John M. McIntosh, Fred Stevie, Steven Barry Valle | 2003-10-14 |
| 6627885 | Method of focused ion beam pattern transfer using a smart dynamic template | John M. McIntosh, Erik Cho Houge, Fred Stevie, Scott Jessen | 2003-09-30 |
| 6606371 | X-ray system | Michael J. Antonell, Erik Cho Houge, John M. McIntosh, Larry E. Plew | 2003-08-12 |
| 6603119 | Calibration method for quantitative elemental analysis | Lucille A. Giannuzzi, Frederick A. Stevie | 2003-08-05 |
| 6577970 | Method of determining a crystallographic quality of a material located on a substrate | Erik Cho Houge, John M. McIntosh, Larry E. Plew, Fred Stevie | 2003-06-10 |
| 6569690 | Monitoring system for determining progress in a fabrication activity | Erik Cho Houge, Isik C. Kizilyalli, John M. McIntosh, Fred Stevie | 2003-05-27 |
| 6534851 | Modular semiconductor substrates | Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Larry E. Plew | 2003-03-18 |
| 6519543 | Calibration method for quantitative elemental analysis | Lucille A. Giannuzzi, Frederick A. Stevie | 2003-02-11 |