JA

John Andberg

AS Aehr Test Systems: 2 patents #2 of 7Top 30%
📍 Santa Cruz, CA: #31 of 176 inventorsTop 20%
🗺 California: #4,287 of 28,521 inventorsTop 20%
Overall (2003): #60,812 of 273,478Top 25%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6580283 Wafer level burn-in and test methods Mark C. Carbone, Frank O. Uher, Jerzy Lobacz, Donald P. Richmond, II 2003-06-17
6556032 Wafer-burn-in and test employing detachable cartridge Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II 2003-04-29