JL

Jerzy Lobacz

AS Aehr Test Systems: 1 patents #5 of 7Top 75%
📍 San Mateo, CA: #64 of 205 inventorsTop 35%
🗺 California: #8,996 of 28,521 inventorsTop 35%
Overall (2003): #198,785 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6580283 Wafer level burn-in and test methods Mark C. Carbone, Frank O. Uher, John Andberg, Donald P. Richmond, II 2003-06-17