Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6580283 | Wafer level burn-in and test methods | Mark C. Carbone, Frank O. Uher, John Andberg, Jerzy Lobacz | 2003-06-17 |
| 6562636 | Wafer level burn-in and electrical test system and method | John Hoang, Jerry Lobacz | 2003-05-13 |
| 6556032 | Wafer-burn-in and test employing detachable cartridge | Frank O. Uher, John Andberg, Mark C. Carbone | 2003-04-29 |