Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6580283 | Wafer level burn-in and test methods | Mark C. Carbone, John Andberg, Jerzy Lobacz, Donald P. Richmond, II | 2003-06-17 |
| 6556032 | Wafer-burn-in and test employing detachable cartridge | John Andberg, Mark C. Carbone, Donald P. Richmond, II | 2003-04-29 |