Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6452415 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Raymond J. Beffa, Eugene H. Cloud | 2002-09-17 |
| 6424168 | Reduced terminal testing system | Warren M. Farnworth, Raymond J. Beffa, Eugene H. Cloud | 2002-07-23 |
| 6420195 | Method of aligning and testing a semiconductor chip package | Jerrold L. King | 2002-07-16 |