RB

Raymond J. Beffa

Micron: 8 patents #103 of 829Top 15%
📍 Boise, ID: #46 of 534 inventorsTop 9%
🗺 Idaho: #67 of 989 inventorsTop 7%
Overall (2002): #2,701 of 266,432Top 2%
8
Patents 2002

Issued Patents 2002

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
6452415 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud 2002-09-17
6437271 Method for sorting integrated circuit devices 2002-08-20
6424168 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 2002-07-23
6373011 Method for sorting integrated circuit devices 2002-04-16
6365861 Method for sorting integrated circuit devices 2002-04-02
6365860 Method for sorting integrated circuit devices 2002-04-02
6363329 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture 2002-03-26
6350959 Method for sorting integrated circuit devices 2002-02-26