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Velt Klee

Infineon Technologies Ag: 1 patents #207 of 647Top 35%
📍 Pleasant Valley, NY: #9 of 25 inventorsTop 40%
🗺 New York: #3,002 of 9,277 inventorsTop 35%
Overall (2002): #96,086 of 266,432Top 40%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6440759 Method of measuring combined critical dimension and overlay in single step Martin Commons, Tobias Mono, John Pohl, Paul Wensley 2002-08-27