MC

Martin Commons

Infineon Technologies Ag: 1 patents #207 of 647Top 35%
📍 Stormville, NY: #11 of 18 inventorsTop 65%
🗺 New York: #3,002 of 9,277 inventorsTop 35%
Overall (2002): #164,089 of 266,432Top 65%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6440759 Method of measuring combined critical dimension and overlay in single step Tobias Mono, Velt Klee, John Pohl, Paul Wensley 2002-08-27