JP

John Pohl

Infineon Technologies Ag: 1 patents #207 of 647Top 35%
📍 Mission Viejo, CA: #39 of 128 inventorsTop 35%
🗺 California: #8,284 of 26,763 inventorsTop 35%
Overall (2002): #185,438 of 266,432Top 70%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6440759 Method of measuring combined critical dimension and overlay in single step Martin Commons, Tobias Mono, Velt Klee, Paul Wensley 2002-08-27