Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6452848 | Programmable built-in self test (BIST) data generator for semiconductor memory devices | Thomas E. Obremski, Peter O. Jakobsen | 2002-09-17 |
| 6426904 | Structures for wafer level test and burn-in | John E. Barth, Jr., Claude L. Bertin, Wayne F. Ellis, Wayne J. Howell, Erik L. Hedberg +3 more | 2002-07-30 |
| 6337595 | Low-power DC voltage generator system | Louis L. Hsu, Rajiv V. Joshi, Russell J. Houghton, Wayne F. Ellis | 2002-01-08 |