Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492822 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith | 2002-12-10 |
| 6335628 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith | 2002-01-01 |