Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492822 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner | 2002-12-10 |
| 6437584 | Membrane probing system with local contact scrub | K. Reed Gleason, Mike Bayne | 2002-08-20 |
| 6335628 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner | 2002-01-01 |