Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6496024 | Probe holder for testing of a test device | — | 2002-12-17 |
| 6492822 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-12-10 |
| 6384615 | Probe holder for low current measurements | — | 2002-05-07 |
| 6335628 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-01-01 |