Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6469316 | Test structure to monitor the effects of polysilicon pre-doping | Mark I. Gardner, David E. Brown | 2002-10-22 |
| 6429052 | Method of making high performance transistor with a reduced width gate electrode and device comprising same | Mark I. Gardner, Frederick N. Hause | 2002-08-06 |
| 6380554 | Test structure for electrically measuring the degree of misalignment between successive layers of conductors | H. Jim Fulford, Mark I. Gardner | 2002-04-30 |
| 6359461 | Test structure for determining the properties of densely packed transistors | Jon D. Cheek, H. Jim Fulford | 2002-03-19 |