Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D383683 | Wafer prober | Osamu Kamata, Masahiko Sugiyama, Munetoshi Nagasaka, Kazumi Yamagata | 1997-09-16 |
| 5642056 | Probe apparatus for correcting the probe card posture before testing | Hisashi Nakajima | 1997-06-24 |
| 5640101 | Probe system and probe method | Motohiro Kuji, Shinji Akaike, Shigeaki Takahashi | 1997-06-17 |