MN

Munetoshi Nagasaka

TL Tokyo Electron Limited: 2 patents #16 of 216Top 8%
TL Tokyo Electron Yamanashi Limited: 1 patents #3 of 45Top 7%
Overall (1997): #29,049 of 185,788Top 20%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
D383683 Wafer prober Osamu Kamata, Masahiko Sugiyama, Haruhiko Yoshioka, Kazumi Yamagata 1997-09-16
5604443 Probe test apparatus Yoshisuke Kitamura 1997-02-18