Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5702956 | Test site and a method of monitoring via etch depths for semiconductor devices | Shu-Lan Ying, Yuan-Chang Huang, Jue-Jye Chen | 1997-12-30 |
YM
Yuh-Jier Mii
Overall (1997): #54,163 of 185,788Top 30%
1
Patents 1997