Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5702956 | Test site and a method of monitoring via etch depths for semiconductor devices | Shu-Lan Ying, Yuan-Chang Huang, Yuh-Jier Mii | 1997-12-30 |
JC
Jue-Jye Chen
Overall (1997): #124,907 of 185,788Top 70%
1
Patents 1997