Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5666049 | Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card | Toshio Yamada, Atsushi Fujiwara, Kazuhiro Matsuyama | 1997-09-09 |
| RE35430 | Semiconductor memory device | Toshio Yamada | 1997-01-21 |